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Poster Presentations
Day 2, June 23（Mon.）
Room P (Maesato East, Foyer, Ocean Wing)
- 2P-AM-47
Development of carbon isotopic measurement for pre-solar grains using TOF-SIMS M6
(Osaka Univ)
oNao Eguchi, Kei Sato, Kentaro Terada
Secondary Ion Mass Spectrometers with magnetic separation, which is a high-sensitive micro-analytical technique of solid surface, have been widely used for isotopic measurement of presolar grains in meteorites. Here we report on the measurement of carbon standard sample and presolar SiC using the TOF-SIMS, M6. The M6 is the latest generation of high-end TOF-SIMS instruments. It consists of Bi Nanoprobe 50 as the primary ion source and a time-of-flight Mass spectrometer for the separation of ions.
We measured CaCO3 in Solnhofen limestone and some candidates of presolar SiC grains obtained from residues of acid treatment. In both analysis, the 13C peak was detected separately from the 12CH peak. As a result of repeated measurement of CaCO3, the obtained standard deviation of 3.0 suggests that this method can be available for presolar grain research. In the measurement of SiC grains, we adopted the conditions to narrow the primary ion beam and precisely adjusted the focus. With the conditions, we could capture the shape of small SiC grains and obtain ion images of grains less than 10 μm. we achieved both sufficient spatial resolution and mass resolution and could measure the 12C/13C isotopic composition of presolar SiC grains using TOF-SIMS M6.