The Mass Spectrometry society of Japan - The 68th Annual Conference on Mass Spectrometry, Japan
Japanese

Abstract

Table of contents

Timetable

Plenary Lectures

Award Lecture

Oral Sessions (Day1, Day2, Day3)

Poster Presentations (Day1, Day2, Day3)

Panel Discussion

Luncheon Seminars (Day1, Day2, Day3)

Corporate Program

Oral Sessions

Day 2, June 23（Thu.）　16:00-16:20　Room C (411 and 412)

2C-O2-1600　　PDF

Identifying False Positive data in mass spectra using peak shapes and mass defect values

(1MS Solutions, 2Preppers, 3Hamamatsu Univ. Sch. Med.)
oYutaka Takahashi1,2,3

In recent years, mass spectrometer (MS) has become more sophisticated and black-boxed, making it possible for anyone to acquire data with simple operations. However, it is undeniable that even in mass spectra obtained by high-performance MS, there is a possibility that non-significant signals, so-called "false positive" data, are mixed in. I would like to introduce a method to identify false positive data by carefully viewing mass spectra with attention to the peak shapes of ion profiles and mass defect values.